The Diffraction Apparatus requires a Combination 1.2 m Track/Optics Bench individually or part of the Dynamics Cart and Track System. By using dots with spacings of about 104 m, visible light can be used instead of X-rays to create diffraction patterns. The light sensor is moved by hand over a 150 mm distance, tracing out the diffraction pattern.
Both the light sensor and position sensor connect to your interface. We will vary the distance between the two slits and the wavelength of light used. Since it is optically based, without gears or racks, it has zero backlash.ĭata collection is performed by choosing a slit, directing the laser through the slit, and choosing an entrance aperture for the light sensor. This lab will examine two slit interference and diffraction from a single slit. In the 17th century, Christiaan Huygens proposed that when a wave reaches an opening, its wavefront can be perceived as individual points emitting spherical. This position sensor uses a precision optical encoder to measure translation with better than 50-micron resolution.
To measure position, the light sensor is mounted on a novel Linear Position Sensor. The light sensor has three ranges, allowing the study of fine details or gross features of patterns. In order to provide excellent spatial resolution, a selectable entrance aperture restricts the width of the pattern viewed by the High Sensitivity Light Sensor. The Linear Position Sensor and High Sensitivity Light Sensor completes the Diffraction Apparatus. Diffraction of light plays a paramount role in limiting the resolving power of any optical instrument (for example: cameras, binoculars, telescopes, microscopes, and the eye). These high-precision slits cast clean diffraction and interference patterns, ideal for quantitative matching of intensity vs. Slits are made by depositing metal film on glass, creating extraordinarily clean slits with fully opaque blocking areas. The included Red Diffraction Laser provides a clean monochromatic light source. The Diffraction Apparatus lets students create, view, and measure diffraction and interference patterns.
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